Books by Rajeshuni Ramesham

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI

23-24 January, 2007, San Jose, California, USA

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields ...

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V

...

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX

25-26 January 2010, San Francisco, California, United States

Includes Proceedings Vol. 7821...

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Reliability, Testing, and Characterization of MEMS/MOEMS III

26-28 January, 2004, San Jose, California, USA

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields ...

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X

24-25 January 2011, San Francisco, California, United States

Includes Proceedings Vol. 7821...

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